Predicting and optimizing jitter and eye-opening based on bitonic step response

As electronic system design evolves to the era of chip-packaging co-design, signal quality prediction and optimization are becoming important for system level interconnects. In this paper, an analytical method for predicting the worst-case jitter and eye-opening based on an arbitrary bitonic step response is proposed. Experimental results show that the proposed technique is able to achieve as small as less than 5% error compared to Hspice simulation. The analytical method is then utilized for fast optimization of a novel distributive passive compensation scheme. © 2007 IEEE.