PublicationMicroscopy and MicroanalysisPaperA comparison of grain size measurements in Al-Cu thin films: Imaging verses diffraction techniquesMicroscopy and MicroanalysisDownload paperAbstractNo abstract available.Home↳ PublicationsDate01 Aug 2002PublicationMicroscopy and MicroanalysisAuthorsLynne GignacC.E. MurrayK.P. RodbellM. GribelyukIBM-affiliated at time of publicationResourcesPublicationShare
