Publication
EDTM 2021
Conference paper

A BEOL Compatible, 2-Terminals, Ferroelectric Analog Non-Volatile Memory

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Abstract

A Ferroelectric Analog Non-Volatile Memory based on a WOxelectrode and ferroelectric HfZrO4 layer is fabricated at a low thermal budget (375°C), enabling BEOL processes and CMOS integration. The devices show suitable properties for integration in crossbar arrays and neural network inference: analog potentiation/depression with constant field or constant pulse width schemes, cycle to cycle and device to device variation <10%, ON/OFF ratio up to 10 and good linearity. The physical mechanisms behind the resistive switching and conduction mechanisms are discussed.

Date

08 Apr 2021

Publication

EDTM 2021

Authors

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