Publication
Electronics Letters
Paper

17ps rise-time measurement by photoemission sampling

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Abstract

We report on the first voltage measurements of signals with rise times below 20 ps by photoemission sampling based on the single-photon process. The high time and voltage resolution together with the potential of a submicrometre spatial resolution enables testing of very high-speed VLSI circuits by this newly developed method. © 1987, The Institution of Electrical Engineers. All rights reserved.

Date

01 Jan 1987

Publication

Electronics Letters

Authors

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