Full wafer technology for semiconductor lasers
- P. Buchmann
- M. Benedict
- et al.
- 1990
- LEOS 1990
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14 results for H.K. Seitz
Full wafer processing and testing-the future of large scale laser fabrication
- P. Vettiger
- M. Benedict
- et al.
- 1990
- ISLC 1990
Contactless high-speed waveform measurements on GaAs integrated circuits with the photoemission sampling technique
- H.K. Seitz
- A. Blacha
- et al.
- 1989
- European Test Conference 1989
Progress in photoemission sampling
- H. Beha
- R. Clauberg
- et al.
- 1989
- CompEuro 1989
Picosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Full-Wafer Technology—a New Approach To Large-Scale Laser Fabrication and Integration
- Peter Vettiger
- Gian-Luca Bona
- et al.
- 1991
- IEEE JQE
Voltage detector and sub-micrometer focusing unit for photoemission probing
- R. Clauberg
- A. Blacha
- et al.
- 1990
- Review of Scientific Instruments
Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications
- R. Clauberg
- H. Beha
- et al.
- 1990
- IBM J. Res. Dev
Contactless, high-speed: Waveform measurements on gallium arsenide ICs
- H.K. Seitz
- A. Blacha
- et al.
- 1990
- IEEE Design and Test of Computers
Photoemission sampling measurements of a dispersing voltage pulse traveling on a transmission line
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Journal of Applied Physics