IBM®
Skip to main content
    Israel [change]    Terms of use
 
 
 
    Home    Products    Services & solutions    Support & downloads    My account    
IBM Research & CRI

IBM Verification Conference 2005

IBM Haifa Labs


Parallel and Distributed Systems: Testing and Debugging (PADTAD - 3)
November 15, 2005
Organized by IBM Research Lab in Haifa, Israel


Scope


The seminar is a full-day event at the IBM Verification Conference 2005, focusing on techniques and systems that aid in the debugging and testing of multi-threaded/parallel/distributed (MPD) application systems. The seminar has a practical and applied emphasis on systems that have been implemented in (at least) prototype form. This seminar concentrates on works whose main contributions are in the field of testing and debugging.

Although debuggers and profilers are the traditional examples of these tools on sequential machines, there are issues unique to MPD systems that are not commonly addressed. For example, deadlock, load imbalance, data sharing patterns, race conditions, and contention are important problems. In order to find some classes of bugs in MPD applications, specific timing conditions are required. As a result, timing bugs are found very late in the testing process or by the end users. Many established testing techniques and tools are insufficient for non-sequential programs.

Please confirm your participation, via the seminar website: http://www.haifa.il.ibm.com/Workshops/verification2005/registration.html

PADTAD Track Topics


  • Tools for the testing or debugging of MPD applications
  • Interactions between memory models and testing
  • Test generation algorithms for MPD applications
  • Debugging advanced network interface technologies (e.g., Myrinet, VIA)
  • Debugging and testing MPD applications
  • Using static analysis or formal verification to enhance debugging and testing of MPD applications
  • Detecting race conditions and deadlocks
  • Debugging and replay of MPD applications
  • Finding timing bugs early in the process
  • Testing real-time MPD applications
  • Fault injection of MPD applications
  • Testing the fault tolerance of MPD applications
  • Testing and debugging techniques for timing related bugs in hardware
  • Pilots in applying new testing techniques to MPD applications

 



Related Seminar Links
Visitors information  
Formal Verification and Testing Technologies in HRL  
PADTAD Home Page  
PADTAD 2004  
PADTAD 2003  
ConTest  


    About IBMPrivacyContact
Caesarea Rothschild Institute (CRI) IBM Research