Softening of breakdown in ultra-thin gate oxide nMOSFETs at low inversion layer density
- S. Lombardo
- F. Crupi
- et al.
- 2001
- Annual Proceedings - Reliability Physics (Symposium)
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2 results at Annual Proceedings - Reliability Physics (Symposium)
Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors
- S. Voldman
- P. Juliano
- et al.
- 2000
- Annual Proceedings - Reliability Physics (Symposium)