CMOS with active well bias for low-power and RF/analog applications
- Clement Wann
- Jay Harrington
- et al.
- 2000
- Digest of Technical Papers-Symposium on VLSI Technology
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3 results at Digest of Technical Papers-Symposium on VLSI Technology
Gate oxide breakdown under Current Limited Constant Voltage Stress
- B.P. Linder
- J.H. Stathis
- et al.
- 2000
- Digest of Technical Papers-Symposium on VLSI Technology
0.18 um modular triple self-aligned embedded split-gate flash memory
- Rebecca Mih
- Jay Harrington
- et al.
- 2000
- Digest of Technical Papers-Symposium on VLSI Technology