Influence of package parasitic elements on CDM stress
- James Di Sarro
- Bill Reynold
- et al.
- 2013
- EOS/ESD 2013
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4 results at EOS/ESD 2013
Maximizing ESD robustness of current-mode-logic (CML) driver with internal gate bias network
- You Li
- James Di Sarro
- et al.
- 2013
- EOS/ESD 2013
Auditing of a class 0 facility
- Icko E. T. Iben
- Michelle Lam
- et al.
- 2013
- EOS/ESD 2013
Investigation of SOI SCR triggering and current sustaining under DC and TLP conditions
- Junjun Li
- James Di Sarro
- et al.
- 2013
- EOS/ESD 2013