Optical nanoprobe electrical microscopy
- Stephen Ippolito
- Michael Tenney
- et al.
- 2013
- ISTFA 2013
Conference paper
Publications
6 results at ISTFA 2013
32nm CMOS SOI test site for emission tool evaluation
- Alan J. Weger
- Franco Stellari
- et al.
- 2013
- ISTFA 2013
Conference paperA Superconducting Nanowire Single-Photon Detector (SnSPD) system for ultra low voltage Time-Resolved Emission (TRE) measurements of VLSI circuits
- Franco Stellari
- Alan J. Weger
- et al.
- 2013
- ISTFA 2013
Conference paperAdvanced fault localization through the use of tester based diagnostics with LVI, LVP, CPA and PEM
- Laura Safran
- John Sylvestri
- et al.
- 2013
- ISTFA 2013
Conference paperAutomatic registering and stitching of TEM/STEM image mosaics
- Chung-Ching Lin
- Franco Stellari
- et al.
- 2013
- ISTFA 2013
Conference paperTester-based methods to enhance spatial resolvability and interpretation of time-integrated and time-resolved emission measurements
- Franco Stellari
- Peilin Song
- et al.
- 2013
- ISTFA 2013
Conference paper