TEST GENERATION FOR FET SWITCHING CIRCUITS.
- J.P. Roth
- Vojin G. Oklobdzija
- et al.
- 1983
- IEEE ITC 1983
Publications
3 results at IEEE ITC 1983
VOTE IN FAVOR OF FAULT SIMULATION.
- J.Lawrence Carter
- 1983
- IEEE ITC 1983
VOTE IN FAVOR OF FAULT SIMULATION.
- J.Lawrence Carter
- 1983
- IEEE ITC 1983