Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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4 results at IEEE ITC 1992

Automatic Pattern Generation for Diagnosis of Wiring Interconnect Faults
- - M. Melton
  - F. Brglez
- 1992
- IEEE ITC 1992
A small test generator for large designs
- - Sandip Kundu
  - Leendert M. Huisman
  - et al.
- 1992
- IEEE ITC 1992
Advances in Membrane Probe Technology
- - J. Kister
  - R.L. Franch
- 1992
- IEEE ITC 1992
AC Test Quality: Beyond Transition Fault Coverage
- - Y. Aizenbud
  - P. Chang
  - et al.
- 1992
- IEEE ITC 1992