AC Test Quality: Beyond Transition Fault Coverage

Abstract

This paper describes a simulator to determine the quality of AC tesls beyond just the transition fault coverage. The notion of sizes of detected delay raults is relevant when modeling point delay defects as described in the literature for CMOS circuits. The computation described in his paper arid the fault sizes computed are valid under the single fault assumption. Experimental results from the simulator are presented for real designs. Such experiments are crucial in determining test strategies that are both cost effective and achieve high test quality.