Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

Date

Start

End

Featured collections

Popular topics

5 results at INFOS 2003

Interface trapping properties of nMOSFETs with Al₂O ₃/SiO_xN_y/Si(1 0 0) gate dielectric stacks after exposure to ionizing radiation
- - J.A. Felix
  - H.D. Xiong
  - et al.
- 2003
- INFOS 2003
Statistics of progressive breakdown in ultra-thin oxides
- - B.P. Linder
  - J.H. Stathis
- 2003
- INFOS 2003
Effect and model of gate oxide breakdown on CMOS inverters
- - R. Rodríguez
  - J.H. Stathis
  - et al.
- 2003
- INFOS 2003
Charge trapping and detrapping in HfO₂ high-κ gate stacks
- - E. Gusev
  - C. D'Emic
  - et al.
- 2003
- INFOS 2003
Charge trapping in SiO₂/HfO₂ gate dielectrics: Comparison between charge-pumping and pulsed I_D-V_G
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- INFOS 2003