Publications

2 results at ISTFA 2005

Advanced optical test of an array an 65 nm CMOS technology
- - Franco Stellari
  - Peilin Song
  - et al.
- 2005
- ISTFA 2005
Conference paper
An overview of 300mm SOI starting wafer quality and its yield detractors
- - Pei Y. Tsai
  - Marlene Almonte
  - et al.
- 2005
- ISTFA 2005
Conference paper