Assembly technology for three dimensional integrated circuitsA. TopolD.C. La Tulipeet al.2005VMIC 2005
New spin-on oxycarbosilane low-k dielectric materials with exceptional mechanical propertiesDubois GeraudTeddie Magbitanget al.2005VMIC 2005
Stress migration reliability of copper interconnect stacked via structures with adjacent copper plates in low k- dielectricsD. NguyenKaushik Chandaet al.2005VMIC 2005
Timing derived current for signal net reliability assessmentJiedong DiaoJim Venutoet al.2005VMIC 2005
Mechanical and dielectric characterization of low-k, porous organosilicatesWilli VolksenTeddie P. Magbitanget al.2005VMIC 2005
CMOS transistor processing compatible with monolithic 3-D integrationB. RajendranR.S. Shenoyet al.2005VMIC 2005