A thermodynamic study of ESD and EOS induced pinned layer reversal in GMR sensors
- Icko Eric Timothy Iben
- 2009
- EOS/ESD 2009
Conference paper
Publications
4 results at EOS/ESD 2009
ESD time-domain characterization of high-k gate dielectric in a 32 nm CMOS technology
- James Di Sarro
- Yang Yang
- et al.
- 2009
- EOS/ESD 2009
Conference paperA study of ESD protection means of cabled GMR sensors
- Michelle Lam
- Icko Eric Timothy Iben
- et al.
- 2009
- EOS/ESD 2009
Conference paperTechnology scaling of advanced bulk CMOS on-chip ESD protection down to the 32nm node
- Junjun Li
- Kiran Chatty
- et al.
- 2009
- EOS/ESD 2009
Conference paper