Labor cost reduction with cloud: An end-to-end view
- Murthy Devarakonda
- Purnendu Gupta
- et al.
- 2013
- CLOUD 2013
Publications
Comprehensive study of effective current variability and MOSFET parameter correlations in 14nm multi-fin SOI FINFETs
- Abhijeet Paul
- Andres Bryant
- et al.
- 2013
- IEDM 2013
Resolution and parallelizability: Barriers to the efficient parallelization of SAT solvers
- George Katsirelos
- Ashish Sabharwal
- et al.
- 2013
- AAAI 2013
Transforming system load to throughput for consolidated applications
- Andrej Podzimek
- Lydia Y. Chen
- 2013
- MASCOTS 2013
High performance UTBB FDSOI devices featuring 20nm gate length for 14nm node and beyond
- Q. Liu
- M. Vinet
- et al.
- 2013
- IEDM 2013
TestEvol: A tool for analyzing test-suite evolution
- Leandro Sales Pinto
- Saurabh Sinha
- et al.
- 2013
- ICSE 2013
Efficient and change-resilient test automation: An industrial case study
- Suresh Thummalapenta
- Pranavadatta Devaki
- et al.
- 2013
- ICSE 2013
A framework for managing cloned product variants
- Julia Rubin
- Marsha Chechik
- 2013
- ICSE 2013
Interaction-based test-suite minimization
- Dale Blue
- Itai Segall
- et al.
- 2013
- ICSE 2013
SemFix: Program repair via semantic analysis
- Hoang Duong Thien Nguyen
- Dawei Qi
- et al.
- 2013
- ICSE 2013