Publications

Density scaling with gate-all-around silicon nanowire MOSFETs for the 10 nm node and beyond
- - Sarunya Bangsaruntip
  - K. Balakrishnan
  - et al.
- 2013
- IEDM 2013
A time-dependent clustering model for non-uniform dielectric breakdown
- - Ernest Y. Wu
  - B. Li
  - et al.
- 2013
- IEDM 2013
200 mm wafer-scale integration of sub-20 nm sacrificial nanofluidic channels for manipulating and imaging single DNA molecules
- - C. Wang
  - S.W. Nam
  - et al.
- 2013
- IEDM 2013
Labor cost reduction with cloud: An end-to-end view
- - Murthy Devarakonda
  - Purnendu Gupta
  - et al.
- 2013
- CLOUD 2013
High performance UTBB FDSOI devices featuring 20nm gate length for 14nm node and beyond
- - Q. Liu
  - M. Vinet
  - et al.
- 2013
- IEDM 2013
TestEvol: A tool for analyzing test-suite evolution
- - Leandro Sales Pinto
  - Saurabh Sinha
  - et al.
- 2013
- ICSE 2013
Guided test generation for web applications
- - Suresh Thummalapenta
  - K. Vasanta Lakshmi
  - et al.
- 2013
- ICSE 2013
Efficient and change-resilient test automation: An industrial case study
- - Suresh Thummalapenta
  - Pranavadatta Devaki
  - et al.
- 2013
- ICSE 2013
A framework for managing cloned product variants
- - Julia Rubin
  - Marsha Chechik
- 2013
- ICSE 2013
Interaction-based test-suite minimization
- - Dale Blue
  - Itai Segall
  - et al.
- 2013
- ICSE 2013