Properties and Microelectronic Applications of Thin Films of Refractory Metal NitridesMarc Wittmer1985JVSTA
Summary Abstract: The interaction mechanism of inelastic electron tunneling spectroscopy probed by high resolution electron energy loss spectroscopyM. LiehrP.A. Thiryet al.1985JVSTA
Reactive sputtering of copper and silicon near the sputtering thresholdT.M. MayerJ.M.E. Harperet al.1985JVSTA
Unoccupied surface state and conduction band critical points of GaP(110): A high resolution inverse photoemission studyD. StraubM. Skibowskiet al.1985JVSTA
Summary Abstract: Low temperature adsorption and reaction of O2 with Si(111) 7×7A.J. Schell-SorokinJ.E. Demuth1985JVSTA
Electron-gun Evaporators of Refractory Metals Compatible with Molecular Beam EpitaxyM. HeiblumJ. Blochet al.1985JVSTA
Raman Spectroscopy of Silicide Formation at the Pt/Crystalline Si InterfaceJ.C. TsangG.W. Rubloffet al.1984JVSTA
Summary Abstract: Electromigration studies of al-intermetallic structuresT. KwokP.S. Hoet al.1984JVSTA