Photoemission spectroscopy study of aluminum-polyimide interface
- J.W. Bartha
- P.O. Hahrt
- et al.
- 1985
- JVSTA
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176 results at JVSTA
Effects of biased cosputtering on resistivity and step coverage in tungsten silicide films
- K.W. Choi
- K.Y. Ahn
- 1985
- JVSTA
Properties and Microelectronic Applications of Thin Films of Refractory Metal Nitrides
- Marc Wittmer
- 1985
- JVSTA
Reactive sputtering of copper and silicon near the sputtering threshold
- T.M. Mayer
- J.M.E. Harper
- et al.
- 1985
- JVSTA
Summary Abstract: Chromium as an inert marker in copper oxidation
- M.A. Frisch
- 1985
- JVSTA
Structure and properties of coevaporated WSix films
- K.Y. Ahn
- S.R. Herd
- et al.
- 1985
- JVSTA
Thin films for optical data storage
- Wen-yaung Lee
- 1985
- JVSTA
Unoccupied surface state and conduction band critical points of GaP(110): A high resolution inverse photoemission study
- D. Straub
- M. Skibowski
- et al.
- 1985
- JVSTA
Theoretical studies of metal clusters and of chemisorption on metals
- P.S. Bagus
- C.J. Nelin
- et al.
- 1984
- JVSTA
Chemical Bonding at the Polyimide Surface
- P.O. Hahn
- G.W. Rubloff
- et al.
- 1984
- JVSTA