Measurement of interface states in palladium silicon diodes
- Howard L. Evans
- Xu Wu
- et al.
- 1986
- Journal of Applied Physics
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118 results for Paul S. Ho
Comments on round table discussion on future trends
- Paul S. Ho
- 1986
- Surface Science
Schottky barrier, electronic states and microstructure at Ni silicide-silicon interfaces
- P.S. Ho
- M. Liehr
- et al.
- 1986
- Surface Science
Oxide characterization and behavior at CuCu and CuCuOx interfaces
- H. Lefakis
- P.S. Ho
- 1986
- Thin Solid Films
Interaction of metals with model polymer surfaces: Core level photoemission studies
- P.N. Sanda
- J.W. Bartha
- et al.
- 1986
- JVSTA
Schottky barrier heights of epitaxial Ni-silicides on Si(111)
- M. Liehr
- P.E. Schmid
- et al.
- 1986
- JVSTA
Atomic structure of the epitaxial Al–Si interface
- F. Legoues
- W. Krakow
- et al.
- 1986
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Molecular orbital analysis of the XPS spectra of PMDA‐ODA polymide and its polyamic acid precursor
- B.D. Silverman
- J.W. Bartha
- et al.
- 1986
- Journal of Polymer Science Part A: Polymer Chemistry
Intermetallic compound formations in titanium-copper thin-film couples
- J.L. Liotard
- D. Gupta
- et al.
- 1985
- Journal of Applied Physics
THIN FILM TECHNOLOGY FOR ADVANCED SEMICONDUCTORS. PART 3: VLSI INTERCONNECT METALIZATION.
- P.S. Ho
- 1985
- Semiconductor International