Publications

2 results for Anthony Pelella

The dawn of predictive chip yield design: Along and beyond the memory lane
- - Rajiv Joshi
  - Rouwaida Kanj
  - et al.
- 2010
- IEEE Design and Test of Computers
Evaluation and alleviation of SOI impacts on SRAM functionality and yield
- - Antonio R. Pelella
  - Rajiv Joshi
  - et al.
- 2008
- IEEE International SOI Conference 2008