65nm CMOS technology for low power applications
- A. Steegen
- R. Mo
- et al.
- 2005
- IEDM 2005
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3 results for Greg M. Johnson
Leakage issues in failure analysis of P+ SiGe active area short monitor
- Ankur Arya
- Greg M. Johnson
- et al.
- 2011
- IPFA 2011
Optimization of DUV lithography for high-energy well implantation
- Ryan Deschner
- Seong-Dong Kim
- et al.
- 2007
- SPIE Advanced Lithography 2007