Precision, double XTEM sample preparation of site specific Si nanowires
- L. Gignac
- S. Mittal
- et al.
- 2009
- Microscopy and Microanalysis
Publications
Date
Featured collections
Popular topics
13 results for S. Mittal
Electromigration in Cu(Al) and Cu(Mn) damascene lines
- C.-K. Hu
- J. Ohm
- et al.
- 2012
- Journal of Applied Physics
Multiple double cross-section transmission electron microscope sample preparation of specific sub-10 nm diameter Si nanowire devices
- Lynne M. Gignac
- Surbhi Mittal
- et al.
- 2011
- Microscopy and Microanalysis