Analysis of DC current crowding in through-silicon-vias and its impact on power integrity in 3D ICsXin ZhaoMichael Scheuermannet al.2012DAC 2012
Transient modeling of TSV-wire electromigration and lifetime analysis of power distribution network for 3D ICsXin ZhaoYang Wanet al.2013ICCAD 2013
Analysis and modeling of dc current crowding for tsv-based 3-d connections and power integrityXin ZhaoMichael R. Scheuermannet al.2014IEEE Transactions on CPMT