Latch design techniques for mitigating single event upsets in 65 nm SOI device technology
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2007
- IEEE TNS
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30 results for H. Tang
A detector system for studying nuclear reactions relevant to Single Event Effects
- Yu. Murin
- Yu. Babain
- et al.
- 2007
- Nucl. Instrum. Methods Phys. Res
Single-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2006
- IEEE TNS
Nuclear processes and soft fails in microelectronics
- Henry H.K. Tang
- 2005
- Nuclear Physics A
Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground
- M. Gordon
- P. Goldhagen
- et al.
- 2004
- IEEE TNS
SEMM-2: A modeling system for single event upset analysis
- Henry H. K. Tang
- Ethan H. Cannon
- 2004
- IEEE TNS
Single-event upsets in microelectronics: Fundamental physics and issues
- Henry H.K. Tang
- Kenneth P. Rodbell
- 2003
- MRS Bulletin
Comparative studies of hydrodynamic and energy transport models
- K. Souissi
- F. Odeh
- et al.
- 1994
- COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
Investigation of the Impact Ionization in the Hydrodynamic Model
- Kamel Souissi
- Farouk Odeh
- et al.
- 1993
- IEEE Transactions on Electron Devices
Nonequilibrium dynamics of hot-electron transport in strong electric fields
- Henry H. K. Tang
- 1992
- Physical Review B