Measurement of Stresses Using Fluorescence in an Optical Microprobe: Stresses around Indentations in a Chromium‐Doped Sapphire
- Steven E. Molis
- David R. Clarke
- 2005
- JACerS
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45 results for S. Molis
Dielectric loss in thin films of an aromatic polyimide
- M.O. Aboelfotoh
- C. Feger
- et al.
- 1993
- Applied Physics Letters
Hydrothermal degradation of r.f. sputter-cleaned chromium-polyimide interfaces
- T.S. Oh
- D.G. Kim
- et al.
- 1991
- Journal of Materials Science Letters
Hydrothermal stability of Cr/polyimide interfaces
- D.G. Kim
- Steve Molis
- et al.
- 1991
- Journal of Adhesion Science and Technology
Some properties of CrxV1-xSi2 and CrxMo1-xSi2 thin films
- O. Thomas
- Steve Molis
- et al.
- 1989
- Applied Surface Science