On the role of interface states in low-voltage leakage currents of metal-oxide-semiconductor structures
- F. Crupi
- C. Ciofi
- et al.
- 2002
- Applied Physics Letters
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Softening of breakdown in ultra-thin gate oxide nMOSFETs at low inversion layer density
- S. Lombardo
- F. Crupi
- et al.
- 2001
- Annual Proceedings - Reliability Physics (Symposium)