Radiation effects in low dielectric constant methyl-silsesquioxane films
- Mihail P. Petkov
- Kelvin G. Lynn
- et al.
- 2002
- IEEE TNS
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6 results for M.P. Petkov
Positron annihilation techniques suited for porosity characterization of thin films
- M.P. Petkov
- C.L. Wang
- et al.
- 2003
- Journal of Physical Chemistry B
Porosity characterization by beam-based three-photon positron annihilation spectroscopy
- Mihail P. Petkov
- Marc H. Weber
- et al.
- 2001
- Applied Physics Letters
Probing capped and uncapped mesoporous low-dielectric constant films using positron annihilation lifetime spectroscopy
- Mihail P. Petkov
- Marc H. Weber
- et al.
- 2000
- Applied Physics Letters
Open volume defects (measured by positron annihilation spectroscopy) in thin film hydrogen-silsesquioxane spin-on-glass; correlation with dielectric constant
- Mihail P. Petkov
- Marc H. Weber
- et al.
- 1999
- Journal of Applied Physics
Doppler broadening positron annihilation spectroscopy: A technique for measuring open-volume defects in silsesquioxane spin-on glass films
- Mihail P. Petkov
- Marc H. Weer
- et al.
- 1999
- Applied Physics Letters