Characterization of Uniformity in Nb/NbxSi1-x/Nb Josephson Junctions
- Ian W. Haygood
- Eric R. J. Edwards
- et al.
- 2019
- IEEE TAS
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2 results for William H. Rippard
Observation of magnetization reversal of thin-film permalloy nanostructures using ballistic electron magnetic microscopy
- W.H. Rippard
- A.C. Perrella
- et al.
- 2000
- Applied Physics Letters