Metrology for 2D materials: a perspective review from the international roadmap for devices and systems
- Umberto Celano
- Daniel Schmidt
- et al.
- 2024
- Nanoscale Advances
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Sub-bandgap defect states in polycrystalline hafnium oxide and their suppression by admixture of silicon
- N.V. Nguyen
- Albert V. Davydov
- et al.
- 2005
- Applied Physics Letters