Publications

2 results for Srinath R. Naidu

Statistical timing for parametric yield prediction of digital integrated circuits
- - Jochen A. G. Jess
  - Kerim Kalafala
  - et al.
- 2006
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical timing for parametric yield prediction of digital integrated circuits
- - J.A.G. Jess
  - K. Kalafala
  - et al.
- 2003
- DAC 2003