Variability analysis under layout pattern-dependent rapid-thermal annealing process
- Yun Ye
- Frank Liu
- et al.
- 2009
- DAC 2009
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5 results for Min Chen
Compact modeling of stress effects in scaled CMOS
- Chi-Chao Wang
- Wei Zhao
- et al.
- 2009
- SISPAD 2009
Modeling of layout-dependent stress effect in CMOS design
- Chi-Chao Wang
- Wei Zhao
- et al.
- 2009
- ICCAD 2009
Fast statistical circuit analysis with finite-point based transistor model
- Min Chen
- Wei Zhao
- et al.
- 2007
- DATE 2007
Finite-point-based transistor model: A new approach to fast circuit simulation
- Min Chen
- Wei Zhao
- et al.
- 2009
- IEEE Transactions on VLSI Systems