A compact eFUSE programmable array memory for SOI CMOSJohn SafranAlan Leslieet al.2007VLSI Circuits 2007
Reliability qualification of CoSI2 electrical fuse for 90NM technologyC. TianB. Parket al.2006IRPS 2006
An investigation of electrical current induced phase transformations in the NiPtSi/polysilicon systemDeok-Kee KimAnthony Domenicucciet al.2008Journal of Applied Physics