Valence and conduction band offsets of a ZrO2/SiO xNy/n-Si CMOS gate stack: A combined photoemission and inverse photoemission study
- S. Sayan
- R.A. Bartynski
- et al.
- 2004
- physica status solidi (b)
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The relationship between local order, long range order, and sub-band-gap defects in hafnium oxide and hafnium silicate films
- D.H. Hill
- R.A. Bartynski
- et al.
- 2008
- Journal of Applied Physics