Fixed- and variable-length ring oscillators for variability characterization in 45nm CMOS
- Ji-Hoon Park
- Liang-Teck Pang
- et al.
- 2009
- CICC 2009
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2 results for Kenneth T. Duong
Large-scale SRAM variability characterization in 45 nm CMOS
- Zheng Guo
- Andrew Carlson
- et al.
- 2009
- IEEE Journal of Solid-State Circuits