Inherent and Stress-Induced Leakage in Heavily Doped Silicon Junctions
- Edward Hackbarth
- Denny Duan-Lee Tang
- 1988
- IEEE T-ED
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Junction Degradation in Bipolar Transistors and the Reliability Imposed Constraints to Scaling and Design
- Denny Duan-Lee Tang
- Edward Hackbarth
- 1988
- IEEE T-ED