The calculation of wave aberration coefficients and wave aberration derivatives from ray trace dataJ.S. WilczynskiR.E. Tibbetts1989Proceedings of SPIE 1989
Design and fabrication of microelectronic lensesR.E. TibbettsJ.S. Wilczynski1989Proceedings of SPIE 1989
A Reduction Camera for Exposure of Microcircuitry onto WafersJ.S. WilcR.E. Tibbettset al.1968IEEE T-ED