Effect of substrate temperature on the microstructure of thin-film silicide
- U. Köster
- K.N. Tu
- et al.
- 2008
- Applied Physics Letters
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9 results for U. Köster
In situ x-ray studies of rapid crystallization of amorphous NiZr2
- S. Brauer
- J.O. Ström-Olsen
- et al.
- 1992
- Physical Review B
Nanocrystalline materials by crystallization of metal-metalloid glasses
- U. Köster
- U. Schünemann
- et al.
- 1991
- Materials Science and Engineering: A
Properties of interfaces in (Cdzn)S/culnse2heterojunctions
- J.E. Lewis
- P.S. Ho
- et al.
- 1984
- JVSTA
Material reactions in Al/Pd2Si/Si junctions. I. Phase stability
- U. Köster
- P.S. Ho
- et al.
- 1982
- Journal of Applied Physics
Material reactions Al/Pd2Si/Si junctions. II. Kinetic rates
- P.S. Ho
- J.E. Lewis
- et al.
- 1982
- Journal of Applied Physics
Thermal reactions between aluminum and palladium layered films
- U. Köster
- P.S. Ho
- et al.
- 1980
- Thin Solid Films
Contact reactions between amorphous silicon and single-crystal metallic films
- U. Köster
- D.R. Campbell
- et al.
- 1978
- Thin Solid Films
Crystallization of amorphous silicon films
- U. Köster
- 1978
- physica status solidi (a)