X-ray Microscopy at Brookhaven

S.F. Fan, W.B. Yun, et al.

Proceedings of SPIE 1989

D. Sayre, J. Kirz, et al.

Ultramicroscopy

C. Buckley, H. Rarback, et al.

Review of Scientific Instruments

Mario G. Baldini, B.K. Kim, et al.

Proceedings of SPIE 1989