Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
The existing theory of the weak-localization correction to resistance in the case of short metallic wires is discussed to obtain some new physical insights. A new theoretical formula for the commonly used four-terminal geometry is derived using the formalism proposed by Doucot and Rammal. It is shown that fits to experimental data can yield substantially different values for the electron-phase relaxation length depending on the boundary conditions imposed in the theory. © 1987 The American Physical Society.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
T. Schneider, E. Stoll
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