Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
The existing theory of the weak-localization correction to resistance in the case of short metallic wires is discussed to obtain some new physical insights. A new theoretical formula for the commonly used four-terminal geometry is derived using the formalism proposed by Doucot and Rammal. It is shown that fits to experimental data can yield substantially different values for the electron-phase relaxation length depending on the boundary conditions imposed in the theory. © 1987 The American Physical Society.
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Mark W. Dowley
Solid State Communications
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
M.A. Lutz, R.M. Feenstra, et al.
Surface Science