George S. Tulevski, Aaron D. Franklin, et al.
ACS Nano
Carbon nanotubes (CNTs) have been widely studied as a channel material of scaled transistors for high-speed and low-power logic applications. In order to have sufficient drive current, it is widely assumed that CNT-based logic devices will have multiple CNTs in each channel. Understanding the effects of the number of CNTs on device performance can aid in the design of CNT field-effect transistors (CNTFETs). We have fabricated multi-CNT-channel CNTFETs with an 80-nm channel length using precise self-assembly methods. We describe compact statistical models and Monte Carlo simulations to analyze failure probability and the variability of the on-state current and threshold voltage. The results show that multichannel CNTFETs are more resilient to process variation and random environmental fluctuations than single-CNT devices.
George S. Tulevski, Aaron D. Franklin, et al.
ACS Nano
Davood Shahrjerdi, Aaron D. Franklin, et al.
ACS Nano
James B. Hannon, Hongsik Park, et al.
BCTM 2014
James B. Hannon, Matthew Copel, et al.
Physical Review Letters