Conference paper
Temperature scaling of nanoscale silicon MOSFETs
V. Sverdlov, Y. Naveh, et al.
European Workshop on Low Temperature Electronics 2002
Aluminum oxide barrier samples were fabricated in situ from Nb/Al/Nb trilayers. It was shown through experimental dc IV curves of two junctions of different areas with the Josephson critical current suppressed by a magnetic field that the data agrees with the Schep-Bauer distribution.
V. Sverdlov, Y. Naveh, et al.
European Workshop on Low Temperature Electronics 2002
R. Emek, Y. Naveh
HLDVT 2003
E. Scheer, W. Belzig, et al.
Physical Review Letters
Y. Naveh, B. Laikhtman
Europhysics Letters