Conference paper
Ion beam alignment for liquid crystal display fabrication
J. Doyle, P. Chaudhari, et al.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
An in situ rf sputter precleaning of the GaAs substrate before AuGeNi ohmic metal deposition yields contact resistance Rc=0.11 Ω mm at a peak doping of ∼1018/cm3. Excellent uniformity and thermal stability are achieved across the wafer. The contacts do not deteriorate appreciably after themal treatment at 410°C for 57 h.
J. Doyle, P. Chaudhari, et al.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
A.C. Callegari, D. Lacey, et al.
Solid-State Electronics
Y. Kato, Y. Nakagawa, et al.
EURODISPLAY 2002
J.H. Magerlein, D.J. Webb, et al.
Journal of Applied Physics