PaperFeedback stabilized force-sensors: A gateway to the direct measurement of interaction potentialsS.P. Jarvis, U. Dürig, et al.Applied Physics A: Materials Science and Processing
PaperDynamic force microscopy by means of the phase-controlled oscillator methodU. Dürig, H.R. Steinauer, et al.Journal of Applied Physics
Conference paperScanning Near-Field Optical Microscopy (SNOM*): Basic Principles and Some Recent DevelopmentsU.C. Fischer, U. DürigProceedings of SPIE 1989
PaperExperimental observation of attractive and repulsive thermal forces on microcantileversB. Gotsmann, U. DürigApplied Physics Letters