Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
The roughness of spin-cast polymer films arises from thermally activated capillary waves during preparation and typically amounts to about 0.5 nm rms measured on a micrometer-sized surface area. Templating from atomically flat mica substrates allows the creation of polymer films with a surface roughness approaching the molecular scale. Three regimes of spatial frequencies are identified in which the roughness is controlled by different physical mechanisms. We find that frozen-in elastic pressure waves ultimately limit the flatness of polymer films. © 2009 American Chemical Society.
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering