S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
We have used a low-temperature, in situ cleaving, scanning tunneling microscope to measure the energy gap in a series of La2-xSrxCuO4-y samples with different Sr doping concentrations x, and therefore different critical temperatures. The current-voltage characteristics vary from measurement to measurement, but consistent results can be obtained by selecting "high-quality" data. We discuss the criteria used for this selection. We find that the measured gaps scale with critical temperature with the ratio 2"kBTc1/45. © 1988 The American Physical Society.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992