About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Paper
Transient conductivity studies in tellurium thin films
Abstract
Laser-induced phase transformations in Te thin films have been studied utilizing time-resolved conductivity measurements. The dynamics of melting, recrystallization, and the onset of amorphization as a function of laser fluence have been investigated. Results are presented for melt duration, depth, and velocities (melt in and regrowth) with ns-time resolution. The necessary conditions for glass formation directly from the melt in Te are also determined. This necessitates complete melt through to the substrate interface and requires no first-order transition. Heat-flow calculations indicate large undercooling in the dynamics of recrystallization and that the material response to the excimer laser radiation is purely thermal.