J.-M.L. Beaujour, A.D. Kent, et al.
Journal of Applied Physics
Time-resolved measurements of spin-transfer-induced (STI) magnetization reversal were made in current-perpendicular spin-valve nanomagnetic junctions subject to a pulsed current bias. These results can be understood within the framework of a Landau-Lifshitz-Gilbert equation that includes STI corrections and a Langevin random field for finite temperature. Comparison of these measurements with model calculations demonstrates that spin-transfer induced excitation is responsible for the observed magnetic reversal in these samples. © 2004 The American Physical Society.
J.-M.L. Beaujour, A.D. Kent, et al.
Journal of Applied Physics
S. Assefa, J.Z. Sun, et al.
INTERMAG 2006
W. Eidelloth, B. Oh, et al.
Applied Physics Letters
R.H. Koch, V. Foglietti, et al.
Applied Physics Letters