Thermoelectric mapping of nanostrucutres

Abstract

The local Seebeck coefficient of nanostructures with nanometer spatial resolution was measured using a scanning thermoelectric microscopy (STEM) technique. It was observed that this technique can be employed to characterize the thermoelectric properties of nanowires and superlattices. The local Seebeck coefficient of a semiconductor was found to be closely related to the carrier concentration. The results show that this technique can be used for carrier profiling.