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Publication
IMECE 2002
Conference paper
Thermoelectric mapping of nanostrucutres
Abstract
The local Seebeck coefficient of nanostructures with nanometer spatial resolution was measured using a scanning thermoelectric microscopy (STEM) technique. It was observed that this technique can be employed to characterize the thermoelectric properties of nanowires and superlattices. The local Seebeck coefficient of a semiconductor was found to be closely related to the carrier concentration. The results show that this technique can be used for carrier profiling.